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Portable device for total reflection X-ray fluorescence analysisOURSTEX200TX

Inventor

Jun Kawai (Kyoto University)

Vendor

Description

pop_tx01.jpg

This total reflection fluorescence analyzer is incredibly small (210mm×297mm). You can operate both qualitative and quantitative analysis on a picogram level.

Its portability allows you to analyze X-ray at any place and may be a great substitute for currently-available costly devices.

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3rd Floor, International Science
Innovation Building, Kyoto University
Yoshidahonmachi, Sakyo-ku, Kyoto
600-8501 JAPAN

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